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"A comprehensive modeling framework for gate stack process dependence of DC ..."

Nilesh Goel et al. (2014)

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DOI: 10.1016/J.MICROREL.2013.12.017

access: closed

type: Journal Article

metadata version: 2020-10-27

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Nilesh Goel, Kaustubh Joshi, S. Mukhopadhyay, N. Nanaware, Souvik Mahapatra:
A comprehensive modeling framework for gate stack process dependence of DC and AC NBTI in SiON and HKMG p-MOSFETs. Microelectron. Reliab. 54(3): 491-519 (2014)

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