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"Identification of the physical signatures of CDM induced latent defects ..."

Yuan Gao et al. (2007)

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DOI: 10.1016/J.MICROREL.2007.07.089

access: closed

type: Journal Article

metadata version: 2020-02-22

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Yuan Gao, Nicolas Guitard, Christophe Salamero, Marise Bafleur, Laurent Bary, Laurent Escotte, Patrick Gueulle, Lionel Lescouzères:
Identification of the physical signatures of CDM induced latent defects into a DC-DC converter using low frequency noise measurements. Microelectron. Reliab. 47(9-11): 1456-1461 (2007)

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