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"Identification of the physical signatures of CDM induced latent defects ..."
Yuan Gao et al. (2007)
- Yuan Gao, Nicolas Guitard, Christophe Salamero, Marise Bafleur, Laurent Bary, Laurent Escotte, Patrick Gueulle, Lionel Lescouzères:
Identification of the physical signatures of CDM induced latent defects into a DC-DC converter using low frequency noise measurements. Microelectron. Reliab. 47(9-11): 1456-1461 (2007)
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