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"Analysis and resolution of a thermally accelerated early life failure ..."

Donald A. Gajewski, Randall D. Lewis, Benjamin M. Decker (2014)

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DOI: 10.1016/J.MICROREL.2014.09.017

access: closed

type: Journal Article

metadata version: 2020-02-22

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Donald A. Gajewski, Randall D. Lewis, Benjamin M. Decker:
Analysis and resolution of a thermally accelerated early life failure mechanism in a 40 V GaN FET. Microelectron. Reliab. 54(12): 2675-2681 (2014)

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