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"Microscopic aspects of defect generation in SiO₂."

Ruggero Feruglio, Fernanda Irrera, Bruno Riccò (2002)

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DOI: 10.1016/S0026-2714(02)00163-4

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/FeruglioIR02
Ruggero Feruglio, Fernanda Irrera, Bruno Riccò:
Microscopic aspects of defect generation in SiO₂. Microelectron. Reliab. 42(9-11): 1427-1432 (2002)

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