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"Single pulse avalanche robustness and repetitive stress ageing of SiC ..."

Asad Fayyaz et al. (2014)

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DOI: 10.1016/J.MICROREL.2014.07.078

access: closed

type: Journal Article

metadata version: 2021-10-14

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Asad Fayyaz, Li Yang, Michele Riccio, Alberto Castellazzi, Andrea Irace:
Single pulse avalanche robustness and repetitive stress ageing of SiC power MOSFETs. Microelectron. Reliab. 54(9-10): 2185-2190 (2014)

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