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"Dielectric breakdown distributions for void containing silicon substrates."

R. Falster, F. Bonoli, V. V. Voronkov (2001)

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DOI: 10.1016/S0026-2714(01)00048-8

access: closed

type: Journal Article

metadata version: 2020-02-22

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R. Falster, F. Bonoli, V. V. Voronkov:
Dielectric breakdown distributions for void containing silicon substrates. Microelectron. Reliab. 41(7): 967-971 (2001)

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