"On the defects introduced by AC and DC hot carrier stress in SOI PD MOSFETs."

M. A. Exarchos et al. (2004)

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DOI: 10.1016/J.MICROREL.2004.07.084

access: closed

type: Journal Article

metadata version: 2020-02-22

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M. A. Exarchos, François Dieudonné, Jalal Jomaah, George J. Papaioannou, Francis Balestra:
On the defects introduced by AC and DC hot carrier stress in SOI PD MOSFETs. Microelectron. Reliab. 44(9-11): 1643-1647 (2004)

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