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"Eyring acceleration model in thick nitride/oxide dielectrics."

S. B. Evseev (2007)

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DOI: 10.1016/J.MICROREL.2007.01.019

access: closed

type: Journal Article

metadata version: 2020-02-22

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S. B. Evseev:
Eyring acceleration model in thick nitride/oxide dielectrics. Microelectron. Reliab. 47(4-5): 748-751 (2007)

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