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"A new degradation model and lifetime extrapolation technique for lightly ..."

R. Dreesen et al. (2001)

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DOI: 10.1016/S0026-2714(00)00225-0

access: closed

type: Journal Article

metadata version: 2022-10-02

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R. Dreesen, Kris Croes, Jean Manca, Ward De Ceuninck, Luc De Schepper, A. Pergoot, Guido Groeseneken:
A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradation. Microelectron. Reliab. 41(3): 437-443 (2001)

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