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"Investigation of the effect of temperature during off-state degradation of ..."

E. A. Douglas et al. (2012)

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DOI: 10.1016/J.MICROREL.2011.09.018

access: closed

type: Journal Article

metadata version: 2021-05-14

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E. A. Douglas, C. Y. Chang, B. P. Gila, M. R. Holzworth, Kevin S. Jones, Lu Liu, Jinhyung Kim, Soohwan Jang, Glen David Via, Fan Ren, Stephen J. Pearton:
Investigation of the effect of temperature during off-state degradation of AlGaN/GaN High Electron Mobility Transistors. Microelectron. Reliab. 52(1): 23-28 (2012)

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