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"Determination of energy and spatial distribution of oxide border traps in ..."

Chunmeng Dou et al. (2014)

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DOI: 10.1016/J.MICROREL.2013.12.023

access: closed

type: Journal Article

metadata version: 2020-02-22

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Chunmeng Dou, Dennis Lin, Abhitosh Vais, Tsvetan Ivanov, Han-Ping Chen, Koen Martens, Kuniyuki Kakushima, Hiroshi Iwai, Yuan Taur, Aaron Thean, Guido Groeseneken:
Determination of energy and spatial distribution of oxide border traps in In_0.53Ga_0.47As MOS capacitors from capacitance-voltage characteristics measured at various temperatures. Microelectron. Reliab. 54(4): 746-754 (2014)

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