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"Comprehensive failure analysis of leakage faults in bipolar transistors."
Bernadette Domengès et al. (2002)
- Bernadette Domengès, P. Schwindenhammer, Patrick Poirier, Felix Beaudoin, Philippe Descamps:
Comprehensive failure analysis of leakage faults in bipolar transistors. Microelectron. Reliab. 42(9-11): 1449-1452 (2002)
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