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"Analytical analysis of nanoscale multiple gate MOSFETs including effects ..."

Fayçal Djeffal et al. (2009)

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DOI: 10.1016/J.MICROREL.2008.12.011

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/DjeffalGDL09
Fayçal Djeffal, Z. Ghoggali, Zohir Dibi, N. Lakhdar:
Analytical analysis of nanoscale multiple gate MOSFETs including effects of hot-carrier induced interface charges. Microelectron. Reliab. 49(4): 377-381 (2009)

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