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"Investigation of reliability issues in high power laser diode bar packages."

Ajit R. Dhamdhere et al. (2003)

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DOI: 10.1016/S0026-2714(02)00280-9

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/DhamdhereMSB03
Ajit R. Dhamdhere, Ajay P. Malshe, William F. Schmidt, William D. Brown:
Investigation of reliability issues in high power laser diode bar packages. Microelectron. Reliab. 43(2): 287-295 (2003)

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