"Fatigue measurement setup under combined thermal and vibration loading on ..."

Karsten M. Decker et al. (2018)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2018.06.003

access: closed

type: Journal Article

metadata version: 2024-10-06

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/DeckerRRB18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/DeckerRRB18
Karsten M. Decker, René M. Rehmann, Mike Roellig, Karlheinz Bock:
Fatigue measurement setup under combined thermal and vibration loading on electronic SMT assembly. Microelectron. Reliab. 87: 125-132 (2018)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.