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"Influence of polysilicon film thickness on radiation response of advanced ..."

Vojkan Davidovic et al. (2007)

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DOI: 10.1016/J.MICROREL.2007.07.025

access: closed

type: Journal Article

metadata version: 2023-09-30

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Vojkan Davidovic, Dimitrios N. Kouvatsos, Ninoslav Stojadinovic, Apostolos T. Voutsas:
Influence of polysilicon film thickness on radiation response of advanced excimer laser annealed polycrystalline silicon thin film transistors. Microelectron. Reliab. 47(9-11): 1841-1845 (2007)

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