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"Negative bias temperature instabilities in sequentially stressed and ..."

Danijel Dankovic et al. (2007)

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DOI: 10.1016/J.MICROREL.2007.07.022

access: closed

type: Journal Article

metadata version: 2024-02-05

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Danijel Dankovic, Ivica Manic, Vojkan Davidovic, Snezana Djoric-Veljkovic, Snezana Golubovic, Ninoslav Stojadinovic:
Negative bias temperature instabilities in sequentially stressed and annealed p-channel power VDMOSFETs. Microelectron. Reliab. 47(9-11): 1400-1405 (2007)

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