"Experimental analysis of Ga2O3: Ti films grown on Si ..."

A. A. Dakhel, W. E. Alnaser (2013)

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DOI: 10.1016/J.MICROREL.2013.01.010

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type: Journal Article

metadata version: 2022-10-02

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A. A. Dakhel, W. E. Alnaser:
Experimental analysis of Ga₂O₃: Ti films grown on Si and glass substrates. Microelectron. Reliab. 53(5): 676-680 (2013)

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