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"High-resolution in-situ of gold electromigration: test time reduction."

Kris Croes et al. (2001)

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DOI: 10.1016/S0026-2714(01)00179-2

access: closed

type: Journal Article

metadata version: 2020-09-08

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Kris Croes, R. Dreesen, Jean Manca, Ward De Ceuninck, Luc De Schepper, Luc Tielemans, P. J. van der Wel:
High-resolution in-situ of gold electromigration: test time reduction. Microelectron. Reliab. 41(9-10): 1439-1442 (2001)

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