"Electrical characterization and quantum modeling of MOS capacitors with ..."

Raphael Clerc et al. (2001)

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DOI: 10.1016/S0026-2714(01)00063-4

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type: Journal Article

metadata version: 2020-09-05

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Raphael Clerc, Alessandro S. Spinelli, Gérard Ghibaudo, Charles Leroux, G. Pananakakis:
Electrical characterization and quantum modeling of MOS capacitors with ultra-thin oxides (1.4-3 nm). Microelectron. Reliab. 41(7): 1027-1030 (2001)

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