Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Hierarchical test generation for combinational circuits with real defects ..."

T. Cibáková et al. (2002)

> Home

Details and statistics

DOI: 10.1016/S0026-2714(02)00080-X

access: closed

type: Journal Article

metadata version: 2020-10-26

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/CibakovaFGKPRU02
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/CibakovaFGKPRU02
T. Cibáková, Mária Fischerová, Elena Gramatová, Wieslaw Kuzmicz, Witold A. Pleskacz, Jaan Raik, Raimund Ubar:
Hierarchical test generation for combinational circuits with real defects coverage. Microelectron. Reliab. 42(7): 1141-1149 (2002)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.