"Degradation of AlGaN/GaN HEMTs under elevated temperature lifetesting."

Yeong-Chang Chou et al. (2004)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2004.03.008

access: closed

type: Journal Article

metadata version: 2020-02-22

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/ChouLSWGCKLLE04
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/ChouLSWGCKLLE04
Yeong-Chang Chou, D. Leung, Ioulia Smorchkova, Mike Wojtowicz, R. Grundbacher, L. Callejo, Q. Kan, R. Lai, P. H. Liu, D. Eng:
Degradation of AlGaN/GaN HEMTs under elevated temperature lifetesting. Microelectron. Reliab. 44(7): 1033-1038 (2004)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.