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"Characteristics of metal-oxide-semiconductor (MOS) device with Er metal ..."
Chel-Jong Choi et al. (2009)
- Chel-Jong Choi, Ha-Yong Yang, Hyo-Bong Hong, Jin-Gyu Kim, Sung-Yong Chang, Jouhahn Lee:
Characteristics of metal-oxide-semiconductor (MOS) device with Er metal gate on SiO2 film. Microelectron. Reliab. 49(4): 463-465 (2009)
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