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"An analytical avalanche breakdown model for double gate MOSFET."

Edward Namkyu Cho, Yong-Hyeon Shin, Ilgu Yun (2015)

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DOI: 10.1016/J.MICROREL.2014.08.019

access: closed

type: Journal Article

metadata version: 2020-02-22

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Edward Namkyu Cho, Yong-Hyeon Shin, Ilgu Yun:
An analytical avalanche breakdown model for double gate MOSFET. Microelectron. Reliab. 55(1): 38-41 (2015)

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