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"The ESD protection characteristic and low-frequency noise analysis of GaN ..."
Hsien-Chin Chiu et al. (2016)
- Hsien-Chin Chiu
, Ji-Fan Chi, Hsuan-Ling Kao
, Chia-Yi Chu, Kuan-Liang Cho, Feng-Tso Chien:
The ESD protection characteristic and low-frequency noise analysis of GaN Schottky barrier diode with fluorine-based plasma treatment. Microelectron. Reliab. 59: 44-48 (2016)
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