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"High temperature storage reliability of palladium coated copper wire in ..."

Pi-Ying Cheng et al. (2018)

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DOI: 10.1016/J.MICROREL.2017.10.036

access: closed

type: Journal Article

metadata version: 2020-02-22

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Pi-Ying Cheng, Po-Ying Lai, Jiun-Ming Ye, Tsung-Chia Chen, Cheng-Li Hsieh:
High temperature storage reliability of palladium coated copper wire in different EFO current settings. Microelectron. Reliab. 80: 1-6 (2018)

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