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"Trap detection in electrically stressed AlGaN/GaN HEMTs using optical pumping."

David J. Cheney et al. (2012)

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DOI: 10.1016/J.MICROREL.2012.08.018

access: closed

type: Journal Article

metadata version: 2020-09-08

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  - https://dblp.org/rec/journals/mr/CheneyDGNRP12
David J. Cheney, Rick Deist, Brent P. Gila, Jennilee Navales, Fan Ren, Stephen J. Pearton:
Trap detection in electrically stressed AlGaN/GaN HEMTs using optical pumping. Microelectron. Reliab. 52(12): 2884-2888 (2012)

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