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"Failure analysis and solutions to overcome latchup failure event of a ..."

Shih-Hung Chen, Ming-Dou Ker (2006)

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DOI: 10.1016/J.MICROREL.2005.09.009

access: closed

type: Journal Article

metadata version: 2020-02-22

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Shih-Hung Chen, Ming-Dou Ker:
Failure analysis and solutions to overcome latchup failure event of a power controller IC in bulk CMOS technology. Microelectron. Reliab. 46(7): 1042-1049 (2006)

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