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"Radiation hardened by design techniques to reduce single event transient ..."
Jianjun Chen et al. (2012)
- Jianjun Chen, Shuming Chen, Bin Liang, Biwei Liu, Fanyu Liu:
Radiation hardened by design techniques to reduce single event transient pulse width based on the physical mechanism. Microelectron. Reliab. 52(6): 1227-1232 (2012)
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