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"Tradeoffs in multichip module yield and cost with known good die ..."

Harry K. Charles Jr. (2001)

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DOI: 10.1016/S0026-2714(00)00251-1

access: closed

type: Journal Article

metadata version: 2020-02-22

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Harry K. Charles Jr.:
Tradeoffs in multichip module yield and cost with known good die probability and repair. Microelectron. Reliab. 41(5): 715-733 (2001)

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