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"High reliability level demonstrated on 980nm laser diode."

J. Van de Casteele et al. (2003)

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DOI: 10.1016/S0026-2714(03)00292-0

access: closed

type: Journal Article

metadata version: 2020-02-22

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J. Van de Casteele, Dominique Laffitte, G. Gelly, C. Starck, M. Bettiati:
High reliability level demonstrated on 980nm laser diode. Microelectron. Reliab. 43(9-11): 1751-1754 (2003)

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