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"Total ionizing dose reliability of thin SiO2 in PowerMOSFET ..."

Alessandra Cascio, Giuseppe Currò, A. Cavagnoli (2007)

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DOI: 10.1016/J.MICROREL.2007.01.007

access: closed

type: Journal Article

metadata version: 2020-02-22

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Alessandra Cascio, Giuseppe Currò, A. Cavagnoli:
Total ionizing dose reliability of thin SiO₂ in PowerMOSFET devices. Microelectron. Reliab. 47(4-5): 815-818 (2007)

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