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"Temperature-dependent noise characterization and modeling of on-wafer ..."

Alina Caddemi, Nicola Donato (2002)

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DOI: 10.1016/S0026-2714(02)00004-5

access: closed

type: Journal Article

metadata version: 2020-02-22

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Alina Caddemi, Nicola Donato:
Temperature-dependent noise characterization and modeling of on-wafer microwave transistors. Microelectron. Reliab. 42(3): 361-366 (2002)

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