"Non-destructive tester for single event burnout of power diodes."

Giovanni Busatto et al. (2001)

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DOI: 10.1016/S0026-2714(01)00211-6

access: closed

type: Journal Article

metadata version: 2020-02-22

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Giovanni Busatto, Francesco Iannuzzo, Francesco Velardi, Jeffery Wyss:
Non-destructive tester for single event burnout of power diodes. Microelectron. Reliab. 41(9-10): 1725-1729 (2001)

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