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"Non-destructive high temperature characterisation of high-voltage IGBTs."

Giovanni Busatto et al. (2002)

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DOI: 10.1016/S0026-2714(02)00205-6

access: closed

type: Journal Article

metadata version: 2023-09-30

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  - journals/mr/BusattoCFBIV02
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  - https://dblp.org/rec/journals/mr/BusattoCFBIV02
Giovanni Busatto, B. Cascone, Luigi Fratelli, M. Balsamo, Francesco Iannuzzo, Francesco Velardi:
Non-destructive high temperature characterisation of high-voltage IGBTs. Microelectron. Reliab. 42(9-11): 1635-1640 (2002)

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