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"Hole injection enhanced hot-carrier degradation in PMOSFETs used for ..."

Alain Bravaix et al. (2004)

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DOI: 10.1016/J.MICROREL.2003.10.002

access: closed

type: Journal Article

metadata version: 2023-09-30

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Alain Bravaix, Didier Goguenheim, Nathalie Revil, E. Vincent:
Hole injection enhanced hot-carrier degradation in PMOSFETs used for systems on chip applications with 6.5-2 nm thick gate-oxides. Microelectron. Reliab. 44(1): 65-77 (2004)

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