"Applying Bayesian mixtures-of-experts models to statistical description of ..."

Olivia Bluder, Michael Glavanovics, Jürgen Pilz (2011)

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DOI: 10.1016/J.MICROREL.2011.06.038

access: closed

type: Journal Article

metadata version: 2024-10-06

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Olivia Bluder, Michael Glavanovics, Jürgen Pilz:
Applying Bayesian mixtures-of-experts models to statistical description of smart power semiconductor reliability. Microelectron. Reliab. 51(9-11): 1464-1468 (2011)

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