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"Conduction and Breakdown Behaviour of Atomic Force Microscopy Grown ..."

X. Blasco, Montserrat Nafría, Xavier Aymerich (2002)

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DOI: 10.1016/S0026-2714(02)00181-6

access: closed

type: Journal Article

metadata version: 2020-02-22

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X. Blasco, Montserrat Nafría, Xavier Aymerich:
Conduction and Breakdown Behaviour of Atomic Force Microscopy Grown SiO₂ Gate Oxide on MOS Structures. Microelectron. Reliab. 42(9-11): 1513-1516 (2002)

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