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"Study of internal behavior in a vertical DMOS transistor under short high ..."
M. Blaho et al. (2003)
- M. Blaho, Dionyz Pogany, Erich Gornik
, Marie Denison, Gerhard Groos, Matthias Stecher:
Study of internal behavior in a vertical DMOS transistor under short high current stress by an interferometric mapping method. Microelectron. Reliab. 43(4): 545-548 (2003)
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