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"Degradation of thin oxides during electrical stress."
Gennadi Bersuker, Yongjoo Jeon, Howard R. Huff (2001)
- Gennadi Bersuker, Yongjoo Jeon, Howard R. Huff:
Degradation of thin oxides during electrical stress. Microelectron. Reliab. 41(12): 1923-1931 (2001)
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