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"Modelling and experimental verification of the impact of negative bias ..."

Néstor Berbel, Raúl Fernández-García, Ignacio Gil (2009)

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DOI: 10.1016/J.MICROREL.2009.06.027

access: closed

type: Journal Article

metadata version: 2022-11-28

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Néstor Berbel, Raúl Fernández-García, Ignacio Gil:
Modelling and experimental verification of the impact of negative bias temperature instability on CMOS inverter. Microelectron. Reliab. 49(9-11): 1048-1051 (2009)

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