"GaAs P-HEMT MMIC processes behavior under multiple heavy ion radiation ..."

Alain Bensoussan et al. (2013)

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DOI: 10.1016/J.MICROREL.2013.07.019

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type: Journal Article

metadata version: 2022-09-07

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Alain Bensoussan, Ronan Marec, Jean Luc Muraro, L. Portal, Philippe Calvel, Catherine Barillot, Marie Genevieve Perichaud, Laurent Marchand, Gael Vignon:
GaAs P-HEMT MMIC processes behavior under multiple heavy ion radiation stress conditions combined with DC and RF biasing. Microelectron. Reliab. 53(9-11): 1466-1470 (2013)

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