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"A step by step methodology to analyze the IGBT failure mechanisms under ..."

Adel Benmansour et al. (2007)

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DOI: 10.1016/J.MICROREL.2007.07.051

access: closed

type: Journal Article

metadata version: 2022-08-03

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Adel Benmansour, Stephane Azzopardi, Jean-Christophe Martin, Eric Woirgard:
A step by step methodology to analyze the IGBT failure mechanisms under short circuit and turn-off inductive conditions using 2D physically based device simulation. Microelectron. Reliab. 47(9-11): 1800-1805 (2007)

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