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"Correlation considerations: Real HBM to TLP and HBM testers."

Jon Barth, John Richner (2002)

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DOI: 10.1016/S0026-2714(02)00054-9

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/BarthR02
Jon Barth, John Richner:
Correlation considerations: Real HBM to TLP and HBM testers. Microelectron. Reliab. 42(6): 909-917 (2002)

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