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"Simulation study of single event effects in the SiC LDMOS with a step ..."
Mengtian Bao et al. (2018)
- Mengtian Bao, Ying Wang, Xingji Li, Chaoming Liu, Cheng-Hao Yu, Fei Cao:
Simulation study of single event effects in the SiC LDMOS with a step compound drift region. Microelectron. Reliab. 91: 170-178 (2018)
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