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"Assessment of the Trench IGBT reliability: low temperature experimental ..."

Stephane Azzopardi et al. (2005)

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DOI: 10.1016/J.MICROREL.2005.07.086

access: closed

type: Journal Article

metadata version: 2020-02-22

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Stephane Azzopardi, A. Benmansour, M. Ishiko, Eric Woirgard:
Assessment of the Trench IGBT reliability: low temperature experimental characterization. Microelectron. Reliab. 45(9-11): 1700-1705 (2005)

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