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"A novel test structure for OxRRAM process variability evaluation."

Hassen Aziza et al. (2013)

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DOI: 10.1016/J.MICROREL.2013.07.012

access: closed

type: Journal Article

metadata version: 2021-12-24

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Hassen Aziza, Marc Bocquet, Jean-Michel Portal, Mathieu Moreau, Christophe Muller:
A novel test structure for OxRRAM process variability evaluation. Microelectron. Reliab. 53(9-11): 1208-1212 (2013)

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