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"Determination of transistor infant failure probability in InGaP/GaAs ..."

K. W. Alt et al. (2007)

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DOI: 10.1016/J.MICROREL.2007.02.007

access: closed

type: Journal Article

metadata version: 2022-02-08

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  - https://dblp.org/rec/journals/mr/AltYHKLIASSBKD07
K. W. Alt, R. E. Yeats, C. P. Hutchinson, D. K. Kuhn, T. S. Low, M. Iwamoto, M. E. Adamski, R. L. Shimon, Timothy E. Shirley, M. Bonse, F. G. Kellert, D. C. D'Avanzo:
Determination of transistor infant failure probability in InGaP/GaAs heterojunction bipolar technology. Microelectron. Reliab. 47(8): 1175-1179 (2007)

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