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"Isolating failing sites in IC packages using time domain reflectometry: ..."

Dolphin Abessolo-Bidzo et al. (2005)

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DOI: 10.1016/J.MICROREL.2005.07.068

access: closed

type: Journal Article

metadata version: 2023-09-28

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Dolphin Abessolo-Bidzo, Patrick Poirier, Philippe Descamps, Bernadette Domengès:
Isolating failing sites in IC packages using time domain reflectometry: Case studies. Microelectron. Reliab. 45(9-11): 1639-1644 (2005)

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