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"Thermal instability during short circuit of normally-off AlGaN/GaN HFETs."

Carmine Abbate, Francesco Iannuzzo, Giovanni Busatto (2013)

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DOI: 10.1016/J.MICROREL.2013.07.119

access: closed

type: Journal Article

metadata version: 2020-02-22

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Carmine Abbate, Francesco Iannuzzo, Giovanni Busatto:
Thermal instability during short circuit of normally-off AlGaN/GaN HFETs. Microelectron. Reliab. 53(9-11): 1481-1485 (2013)

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